The aim of the dimensionCONTROL measuring system is the contactless geometry measurement of ingots. In detail, the deviation of the side lengths, phase lengths, angles and diagonal lengths are measured in relation to the specified target values.
In a partially automated setup process, the recording prism and the sensors are first set and calibrated. The ingot block to be measured can then be inserted. The measuring carriage moves the four laser-optical triangulation line scanners of the type for scanCONTROL LLT 2800 along the ingot block. The system automatically measures and archives deviations from the specified target values for side lengths, phase lengths, angles and diagonal lengths.
Principle of laser line triangulation
In the principle of scanning with optical triangulation, a laser line is projected onto the surface of the measuring object via a line optics. The diffusely reflected light of this laser line is projected onto a CMOS matrix via high-quality optics and evaluated two-dimensionally. Laser line triangulation is essentially the same as triangulating a laser point, but during the measurement a series of lines are simultaneously illuminated using the laser line. In addition to the distance information (Z-axis), the exact position of each point on the laser line (X-axis) is also recorded and output by the system.
| Measurement accuracies | |
| Side length | |
| Resolution: | A ≤ 20 μm |
| Repeatability: | cgm ≤ 1,33 Production tolerance T ≥ ± 0,40 mm |
| chamfer | |
| Resolution: | A ≤ 14 μm |
| Repeatability: | cgm ≤ 1,33 |
| Produktionstoleranz T ≥ ± 0,28 mm | |
| diagonal | |
| Resolution: | A ≤ 40 μm |
| Repeatability: | cgm ≤ 1,33 Production tolerance T ≥ ± 0,50 mm |
| angel | |
| Resolution: | A ≤ 0,005 ° |
| Repeatability: | cgm ≤ 1,33 Production tolerance T ≥ ± 0,10 ° |
| Target Properties | |
| Targetmaterial | Silizium, Waferblöcke (Ingots) - geschnitten, quadriert, gefast |
| Oberfläche | Matt grau bis spiegelnd mit unterschiedlichen Rauhigkeiten. Innerhalb einer Seitenfläche homogen, mit ausreichendem Streulichtanteil |
| Querschnitt | min. 125 x 125 mm, max. 210 x 210 mm |
| Länge | min. 150 mm, max. 800 mm |
| Gewicht | min. 3,5 kg, max. 83 kg |
| Anlagenkennwerte | |
| Maße Meßsystem (L x B x H) | 2350 x 850 x 1500 mm |
| Gewicht: | ca. 900 kg |
| Eigenschaften IPC | Intel Core Duo / 2 GHz / 1 GB RAM / Windows XP |
| Netzspannung: | 230 V / 50 Hz |
| Schutzart: | IP 20 |
| Umweltbedingungen | |
| Umgebungstemperatur | min + 15 °C / max. + 40 °C |
| Temperaturschwankungen während des Betriebes | ±5 °C |
| Rel. Luftfeuchte | Max. 75 % im angegebenen Temperaturbereich |
| Produktoberflächentemperatur | min + 20° C / max. + 45° C |
| Condition | Used |
| Age rating | No age restriction |
| Model | dimCONTROL 8260 |
| Manufacturer | MICRO-EPSILON-MESSTECHNIK GmbH & Co. KG |
| Content | 1 piece |
| Weight | 900000 g |
| Dimensions | 2380×850×1500mm |
| Item ID | 1234578439 |
| Item ID | 1234578439 |