Stationary SPECTRO SPECTROLAB F metal analysis device for quantitative material analysis using optical emission spectrometry (OES) or spark spectrometry. The system is designed for the analysis of copper-based materials. Installed and documented are the programs CU-00 for standardization of the Cu base, CU-20 for Cu/Zn alloys, and CU-70 for Cu/Al alloys. The spectrometer features three documented optics and measurement channels for numerous alloying and accompanying elements. Elements detected include Cu, Zn, Pb, Sn, Al, Fe, Ni, Si, Mn, Mg, Cr, Co, Cd, Sb, P, and S. Extensive original documentation is available for the device, including test and photomultiplier protocols, configuration documents, standardization documents, and the user manual for the Spark Analyzer Vision software. Various recalibration and reference samples as well as accessories are also included. An existing analysis printout from 20.12.2022 documents the practical use of the system for the analysis of CuZn40Pb2 materials. The printout shows measured values for numerous alloying and trace elements. The device is used for stationary metal and alloy analysis in laboratories and quality assurance.

Used condition with age- and usage-related signs of wear. The device is from the year 2004. Extensive device-specific documentation, accessories, and recalibration or reference samples are available. Use or performance of material analyses is documented by existing analysis printouts from December 2022. The current functional, calibration, and standardization status has not been fully checked. Therefore, current measurement accuracy or calibration is not guaranteed.

Scope of delivery:
1 SPECTRO SPECTROLAB F metal analysis device
Available recalibration and reference samples
Various sample bodies and standards
Set of cables or existing connection lines
Small parts and consumables
Adapter for small parts
Available boron nitride discs
Available SPECTRO accessories
Software and data carriers, including SPECTRO Data Backup
Documentation and test records
User manual Spark Analyzer Vision
Documents for DIA 2000 and DIA2000SE
Photomultiplier test protocols
Configuration and standardization documents
PC, monitor are listed in the original delivery documents. Whether these components are part of the currently available scope of delivery cannot be clearly determined.

* Order number: LAVFC01A
* Series: SPECTROLAB F
* Year of manufacture: 2004
* Measurement method: Optical Emission Spectrometry OES / Spark Spectrometry
* Design: Stationary metal analyzer
* Readout system: MIKRO 8
* Calibration: Cu-base
* Applications: Cu-20 / Cu-70
* Standardization: CU-00 – Cu-base
* Installed programs: CU-00 – Standardization Cu-base; CU-20 – Cu/Zn alloys; CU-70 – Cu/Al alloys
* Optical system: 1 × UV optics with 6 lines; 2 × air optics with 13 / 7 lines
* Optics 1: 3600 / 750
* Optics 2: 3600 / 750
* Optics 3: 2400 / 750
* Monochromator: No
* Excitation source: 3000 / 300 Hz / Pure Ar
* Operating voltage: 230 V
* Mains frequency: 50 Hz
* Input supply nameplate: 230 VAC / 50/60 Hz
* Power: 1500 VA
* Operating language: German
* Documented elements: Cu, Zn, Pb, Sn, Al, Fe, Ni, Si, Mn, Mg, Cr, Co, Cd, Sb, P, S
* Documented wavelengths / measurement lines: P 178.287 nm; S 180.731 nm; Sn 189.989 nm / 317.502 nm; Sb 206.833 nm; Cd 228.802 nm; Mn 263.817 nm / 293.306 nm; Cr 267.716 nm; Fe 273.074 nm / 371.994 nm; Mg 285.213 nm; Si 288.160 nm / 390.553 nm; Cu 296.117 nm / 453.082 nm; Al 308.216 nm / 394.403 nm; Zn 334.502 nm / 472.216 nm; Co 345.351 nm; Ni 352.454 nm / 376.946 nm; Pb 405.782 nm
* Photomultiplier: Mainly R6350, individual UV channels R6351
* Software: DIA 2000 Base / DIA2000SE; Spark Analyzer Vision
* Software version: 1.40.0005
* Manual version Spark Analyzer Vision: 09/2004

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* Length: approx. 80 cm
* Width: approx. 150 cm
* Height: approx. 160 cm